Cantilever

Description

Elbatech is an authorized distributor for MikroMasch products. Find your item and contact us for an offer. 
Special quantity discounts

Cantilevers:
Basic techniques and recommended types of cantilevers and for different SPM applications.

 Contact AFM mode

Topography imaging: Contact mode. Ambient air and fluids.

 Noncontact AFM mode

Topography imaging: Noncontact mode. Vacuum conditions.

 Intermittent contact (Tapping) mode

Topography imaging: Intermittent contact (Tapping) mode. Ambient air and fluids.

 High Resolution Imaging

Topography imaging: Measuring features at the nanoscale using HI'RES probe.

 Phase imaging

Material - Sensitive Contrast: Phase imaging.

 Force Modulation

Material sensitive contrast: Force modulation.

 Soft Contact, LFM

Study of soft samples in Contact mode and Lateral Force Microscopy.

 Electric Contact Modes

Scanning Spreading Resistance Microscopy (SSRM), Scanning Capacitance Microscopy (SCM), etc.

 Electric Dynamic Modes

Scanning Kelvin Probe Microscopy (SKPM), Electrostatic Force Microscopy (EFM), etc.

 Magnetic Force Microscopy

Two-pass techniques for the study of the magnetic properties.

 

Calibration Gratings

Sets of calibration gratings

There are 3 sets of calibration gratings (TGS01, TGS02, and TGS03), which are grouped by applications. Z-calibration gratings are NIST-traceable in the TGS01C and TGS02C sets.

Grating Set

TGS01

TGS01C

TGS02

TGS02C

TGS03

TGX01 (lateral calibration)

I

I

I

PA01 (tip characterization)

I

I

I

TGG01 (linear distortions)

I

I

I

TGZ01 (vertical calibration, 20 nm)

I

C

I

C

TGZ02 (vertical calibration, 100 nm)

I

C

I

C

TGZ03 (vertical calibration, 500 nm)

I

C

I

C

I : The calibration grating is included in the set.
C : The calibration grating is included in the set with individual MikroMasch calibration certificate, NIST-traceable.
 

Highly Ordered Pyrolytic Graphite (HOPG)

There are several grades of HOPG. We use notations developed by Advanced Ceramics Corporation, the leading company in HOPG production.

ZYA Grades: 0.4░▒0.1░ Mosaic Spread. This is the most perfect HOPG, lateral grain size is typically up to about 10 Ám.
Thus, it is the best "cleavable" material exhibiting the smoothest surface that is needed for crucial SPM measurements.
ZYB Grades: 0.8░▒0.2░ Mosaic Spread. Slightly less highly ordered. The lateral grain size is up to 1 Ám.
ZYH Grades: 3.5░▒1.5░ Mosaic Spread. It has a grain size in the range of 30-40 nm

HOPG(ZYH)10/5 HOPG (ZYH quality). Nominal dimensions 1x10x10 mm. 5 pcs. HOPG(ZYH)20/5 HOPG (ZYH quality). Nominal dimensions 2x10x10 mm. 5 pcs. 
HOPG(ZYB)10/3 HOPG (ZYB quality). Nominal dimensions 1x10x10 mm. 3 pcs. 
HOPG(ZYB)20/3 HOPG (ZYB quality). Nominal dimensions 2x10x10 mm. 3 pcs. 
HOPG(ZYA)10 HOPG (ZYA quality). Nominal dimensions 1x10x10 mm. 1 pc. 
HOPG(ZYA)20 HOPG (ZYA quality). Nominal dimensions 2x10x10 mm. 1 pc. 

More info...

 

Porous Aluminum

Porous Aluminum - Tip Characterizer
The form of the scanning probe tip is very important for obtaining AFM images of high quality. As new AFM tips with nanometer curvature radius become widespread, tip characterizers that have surface features of the same or better sharpness should be used to estimate parameters of the tip.

A thin film of porous aluminum consists of hexagonal hollow cells of up to 300-nm height and 30..250-nm cross section. AFM images of the structure are presented above. The images were obtained using different probe tips: conventional tip with curvature radius Rc ~ 10 nm (Fig. 1) and a tip of nanometer curvature radus (Fig. 2).
 

 

 

 

Scan size Height
1 um 70 nm

Fig.1 AFM image of Porous Aluminum. Conventional probe with tip curvature radius Rc < 10nm.

 

Parameters of the Porous Aluminum structure:

The thickness of the foil sample .......................................................................... 500 nm
Sample dimensions ............................................................................................. 5x5 mm
Effective area ...................................................................................................... 3x3 mm
Pore depth .......................................................................................................... 40 nm
Pitch between the pores ..................................................................................... 100▒10nm
Thickness of the partitions between the pores ................................................... about 5 nm
Curvature radius of the spikes formed at the intersections of the partitions ...... 2..3 nm
Data obtained using conventional probe tip (Fig.1) is in good agreement with those published in literature [1]. Images in Fig. 2 reveal new details of the surface of porous aluminum. Generally, these images are free from the convolution effect that is due to the finite size of the scanning tip. It was found that the form of the surface pore differs from the ideal hexagon, and there are also elevations in the nodal points of the adjacent cells. Curvature radii of the spikes made by these elevations are as small as 2-3 nm, which could not be imaged by conventional tips.

Scan size Height
1 um 80 nm
Fig.2 AFM image of the same test structure made by probe with tip curvature radius Rc < 1 nm

 

Home