Force vs. distance curve

 

Force vs. distance (F vs. d) curves are used to measure the vertical force that the tip applies to the surface while a contact-AFM image is being taken.

It is a plot of the deflection of the cantilever versus the extension of the piezoelectric scanner. The van der Waals force curve represents just one contribution to the cantilever deflection. Local variations in the form of the F vs. d curve indicate variations in the local elastic properties. Contaminants and lubricants affect the measurement, as does the thin layer of water that is often present when operating an AFM in air.

 A typical curve of an  AFM operating in air is depicted in the Figure. At the left side of the curve, the scanner is fully retracted and the cantilever is undeflected since the tip is not touching the sample. As the scanner extends, the cantilever remains undeflected until it comes close enough to the sample surface for the tip to experience the attractive van der Waals force. The tip snaps into the surface. As the scanner continues to extend, the cantilever deflects away from the surface, approximately linearly. After full extension, at the extreme right of the plot, the scanner begins to retract. The retracting curve is often different, because a monolayer or a few monolayers of water are present on many surfaces. This water layer exerts a capillary force that is very strong and attractive. As the scanner pulls away from the surface, the water holds the tip in contact with the surface, bending the cantilever strongly towards the surface (region c). At some point, depending upon the thickness of the water layer, the scanner retracts enough that the tip springs free (point d, snap-back point). As the scanner continues to retract beyond the snap-back point, the cantilever remains undeflected as the scanner moves it away from the surface in free space.
If additional layers are present along with the water layer, multiple snap-back points can occur: the positions and amplitudes of the snap-back points depend upon the viscosity and thickness of the layers present on the surface.
 

 

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